A re-emitted positron energy spectrometerGOODYEAR, A; COLEMAN, P. G.Measurement science & technology (Print). 1995, Vol 6, Num 4, pp 415-421, issn 0957-0233Article

Savitzky and Golay differentiation in AESGILMORE, I. S; SEAH, M. P.Applied surface science. 1996, Vol 93, Num 3, pp 273-280, issn 0169-4332Article

Improvement of Auger spectra using A.C. modulation techniqueRAGHEB, M. S; BAKR, M. H. S.Radiation physics and chemistry (1993). 1996, Vol 47, Num 5, pp 673-675, issn 0969-806XConference Paper

Energy calibration of X-ray photoelectron spectrometers: results of an interlaboratory comparison to evaluate a proposed calibration procedurePOWELL, C. J.Surface and interface analysis. 1995, Vol 23, Num 3, pp 121-132, issn 0142-2421Article

Atomic ratios determined by EELS under parallel and convergent illumination conditionsSU, D. S; WANG, H. F.Ultramicroscopy. 1995, Vol 57, Num 4, pp 323-325, issn 0304-3991Article

The development of Auger spectroscopy as a probe of local electronic structureWEIGHTMAN, P.Microscopy microanalysis microstructures (Les Ulis). 1995, Vol 6, Num 3, pp 263-288, issn 1154-2799Article

Development of the EXELFS technique for high accuracy structural informationQIAN, M; SARIKAYA, M; STERN, E. A et al.Ultramicroscopy. 1995, Vol 59, Num 1-4, pp 137-147, issn 0304-3991Conference Paper

Electron energy loss spectroscopy and imaging. I: Techniques. II: InstrumentationKRIVANEK, Ondrej L.Ultramicroscopy. 1995, Vol 59, Num 1-4, issn 0304-3991, 292 p.Conference Proceedings

The influence of plural scattering on EELS elemental analysisSU, D. S; WANG, H. F; ZEITLER, E et al.Ultramicroscopy. 1995, Vol 59, Num 1-4, pp 181-190, issn 0304-3991Conference Paper

Intercomparison of algorithms for background correction in XPSJANSSON, C; TOUGAARD, S; ANDERSON, C. A et al.Surface and interface analysis. 1995, Vol 23, Num 7-8, pp 484-494, issn 0142-2421Article

Analytical background correction in numerical Fourier transform procedures. Application to electron spectroscopyAMINOV, K. L; PEDERSEN, J. B.Surface and interface analysis. 1995, Vol 23, Num 10, pp 717-722, issn 0142-2421Article

A new apparatus for impact collision ion scattering spectroscopyKAWAMOTO, K; INARI, K; MORI, T et al.Japanese journal of applied physics. 1995, Vol 34, Num 9A, pp 4917-4919, issn 0021-4922, 1Article

Enhanced resolution of depth profiles using two-dimensional XPS dataAMINOV, K. L; JORGENSEN, J. S; BOIDEN PEDERSEN, J et al.Surface and interface analysis. 1996, Vol 24, Num 1, pp 23-27, issn 0142-2421Article

Sources of internal scattering of electrons in a cylindrical mirror analysis (CMA)EL GOMATI, M. M; EL BAKUSH, T. A.Surface and interface analysis. 1996, Vol 24, Num 3, pp 152-162, issn 0142-2421Article

Delocalization in inelastic scatteringMULLER, D. A; SILCOX, J.Ultramicroscopy. 1995, Vol 59, Num 1-4, pp 195-213, issn 0304-3991Conference Paper

Measurement of TEM primary energy with an electron energy-loss spectrometerMEYER, C. E; BOOTHROYD, C. B; GUBBENS, A. J et al.Ultramicroscopy. 1995, Vol 59, Num 1-4, pp 283-285, issn 0304-3991Conference Paper

Theory of scanning tunneling spectroscopy based on the resonant tunneling model II : relation between different appraochesMAKOSHI, K; MII, T.Japanese journal of applied physics. 1995, Vol 34, Num 6B, pp 3325-3328, issn 0021-4922, 1Conference Paper

Cryo-electron energy loss spectroscpy: observations on vitrified hydrated specimens and radiation damageLEAPMAN, R. D; SUN, S.Ultramicroscopy. 1995, Vol 59, Num 1-4, pp 71-79, issn 0304-3991Conference Paper

High-performance current-voltage measurement system for scanning tunneling spectroscopy of deposited moleculesOKUMURA, A; NAKAGAWA, H; MIYAMURA, K et al.Japanese journal of applied physics. 1995, Vol 34, Num 4A, pp 2055-2056, issn 0021-4922, 1Article

A position-sensitive detector mounted on an inner-shell electron energy-loss spectrometerHANNAY, C; HEINESCH, J; KLEYENS, U et al.Measurement science & technology (Print). 1995, Vol 6, Num 8, pp 1140-1143, issn 0957-0233Article

General formulation for ALCHEMIHORITA, Z; MATSUMURA, S; BABA, T et al.Ultramicroscopy. 1995, Vol 58, Num 3-4, pp 327-335, issn 0304-3991Article

Micro-spectroscopy with high spatial resolutionUMBACH, E.Physica. B, Condensed matter. 1995, Vol 208-09, pp 193-198, issn 0921-4526Conference Paper

Progress in electron Compton scatteringSCHATTSCHNEIDER, P; EXNER, A.Ultramicroscopy. 1995, Vol 59, Num 1-4, pp 241-253, issn 0304-3991Conference Paper

Momentum dependent energy loss near edge structures using a CTEM: the reliability of the methods availableBOTTON, G. A; BOOTHROYD, C. B; STOBBS, W. M et al.Ultramicroscopy. 1995, Vol 59, Num 1-4, pp 93-107, issn 0304-3991Conference Paper

Analyzing line scan EELS data with neural pattern recognitionGATTS, C; DUSCHER, G; MÜLLEJANS, H et al.Ultramicroscopy. 1995, Vol 59, Num 1-4, pp 229-239, issn 0304-3991Conference Paper